What is the difference between SIwave and HFSS in via modeling?
What are the strengths and limitations of SIwave versus HFSS when extracting S-parameters for drilled holes? In which scenarios should each tool be selected?
2Answer
High-frequency discrepancies are typically caused by the following: 1 Material parameters (Dk/Df) not accurately modeled for frequency dependence; 2 Conductor surface roughness model not enabled; 3 Inconsistent port calibration reference planes. First, verify material settings and enable the Huray roughness model, then compare simulated and measured group delay.
Additionally, verify that the mesh is sufficiently fine. At high frequencies, the skin depth decreases, so ensure there are at least 3 to 4 mesh layers across the conductor cross-section. Also, placing radiation boundaries too close to conductors can introduce errors.
Write Answer
Answer to get+5 points